As one of the largest back-end toll processing company in Korea.
Our R&D and QA team are capable of conducting various reliability test.
As you see in the page we have obtained various testing equipments in order to provide precise and accurate data.
High power scope
Low power scope
FE – SEM / EDX
As you see, these are the examples of the scope of our reporting.
Having such feedback process we strive to find the issues as early as possible, respond to the issues as early as possible.
- Model: JSM7610 (JEOL)
- Resolution : 1.0nm at 15kV, 1.5nm at 1kV
- Magnification: X25 to X1,000,000
- Accelerating Voltage : 0.1kV to 30kV
FE-SEM is a tool for physical analysis. It uses very high magnification without charging or
damaging the device with their high beam currents, so It is possible to observe the fine surface
morphology of nanostructure and to obtain compositional and structural analysis.